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Defect Classification Using Postpeak Value for Pulsed Eddy-Current Technique
In this paper, a feature termed as the postpeak value is proposed for the pulsed eddy current technique (PECT). Moreover, a method using the postpeak value is proposed to classify surface and reverse defects. A PECT system is built for verification purposes. Experiment results prove that the postpea...
Autores principales: | Ge, Jiuhao, Yang, Chenkai, Wang, Ping, Shi, Yongsheng |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2020
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7349699/ https://www.ncbi.nlm.nih.gov/pubmed/32560050 http://dx.doi.org/10.3390/s20123390 |
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