Anomaly Detection Neural Network with Dual Auto-Encoders GAN and Its Industrial Inspection Applications

Recently, researchers have been studying methods to introduce deep learning into automated optical inspection (AOI) systems to reduce labor costs. However, the integration of deep learning in the industry may encounter major challenges such as sample imbalance (defective products that only account f...

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Detalles Bibliográficos
Autores principales: Tang, Ta-Wei, Kuo, Wei-Han, Lan, Jauh-Hsiang, Ding, Chien-Fang, Hsu, Hakiem, Young, Hong-Tsu
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7349725/
https://www.ncbi.nlm.nih.gov/pubmed/32545489
http://dx.doi.org/10.3390/s20123336

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7349725/
https://www.ncbi.nlm.nih.gov/pubmed/32545489
http://dx.doi.org/10.3390/s20123336

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