Characterizing transition-metal dichalcogenide thin-films using hyperspectral imaging and machine learning

Atomically thin polycrystalline transition-metal dichalcogenides (TMDs) are relevant to both fundamental science investigation and applications. TMD thin-films present uniquely difficult challenges to effective nanoscale crystalline characterization. Here we present a method to quickly characterize...

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Detalles Bibliográficos
Autores principales: Shevitski, Brian, Chen, Christopher T., Kastl, Christoph, Kuykendall, Tevye, Schwartzberg, Adam, Aloni, Shaul, Zettl, Alex
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7360754/
https://www.ncbi.nlm.nih.gov/pubmed/32665582
http://dx.doi.org/10.1038/s41598-020-68321-7

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7360754/
https://www.ncbi.nlm.nih.gov/pubmed/32665582
http://dx.doi.org/10.1038/s41598-020-68321-7

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