Optical Characterization of As(x)Te(100−x) Films Grown by Plasma Deposition Based on the Advanced Optimizing Envelope Method

Three As(x)Te(100)(−)(x) films with different x and dissimilar average thickness [Formula: see text] are characterized mainly from one interference transmittance spectrum T(λ = 300 to 3000 nm) of such film on a substrate based on the advanced optimizing envelope method (AOEM). A simple dual transfor...

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Detalles Bibliográficos
Autores principales: Minkov, Dorian, Angelov, George, Nestorov, Radi, Nezhdanov, Aleksey, Usanov, Dmitry, Kudryashov, Mikhail, Mashin, Aleksandr
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7372394/
https://www.ncbi.nlm.nih.gov/pubmed/32635359
http://dx.doi.org/10.3390/ma13132981

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7372394/
https://www.ncbi.nlm.nih.gov/pubmed/32635359
http://dx.doi.org/10.3390/ma13132981

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