Nanomotion detection based on atomic force microscopy cantilevers

Atomic force microscopes (AFM) or low-noise in-house dedicated devices can highlight nanomotion oscillations. The method consists of attaching the organism of interest onto a silicon-based sensor and following its nano-scale motion as a function of time. The nanometric scale oscillations exerted by...

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Detalles Bibliográficos
Autores principales: Kohler, A.C., Venturelli, L., Longo, G., Dietler, G., Kasas, S.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Elsevier 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7388971/
https://www.ncbi.nlm.nih.gov/pubmed/32743137
http://dx.doi.org/10.1016/j.tcsw.2019.100021

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7388971/
https://www.ncbi.nlm.nih.gov/pubmed/32743137
http://dx.doi.org/10.1016/j.tcsw.2019.100021

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