Extraction technique of trap states based on transient photo-voltage measurement

This article puts forward a technique for extracting the density of trap states (DOS(T)) distribution based on the transient photo-voltage (TPV) measurement result. We prove that when the TPV result is linear, the DOS(T) distribution is exponential type and vice versa. Compared to the approach based...

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Detalles Bibliográficos
Autor principal: Lin, Zedong
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7393153/
https://www.ncbi.nlm.nih.gov/pubmed/32732950
http://dx.doi.org/10.1038/s41598-020-69914-y

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7393153/
https://www.ncbi.nlm.nih.gov/pubmed/32732950
http://dx.doi.org/10.1038/s41598-020-69914-y

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