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Extraction technique of trap states based on transient photo-voltage measurement
This article puts forward a technique for extracting the density of trap states (DOS(T)) distribution based on the transient photo-voltage (TPV) measurement result. We prove that when the TPV result is linear, the DOS(T) distribution is exponential type and vice versa. Compared to the approach based...
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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Nature Publishing Group UK
2020
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7393153/ https://www.ncbi.nlm.nih.gov/pubmed/32732950 http://dx.doi.org/10.1038/s41598-020-69914-y |