Application of FIB-SEM Techniques for the Advanced Characterization of Earth and Planetary Materials

Advanced microanalytical techniques such as high-resolution transmission electron microscopy (HRTEM), atom probe tomography (APT), and synchrotron-based scanning transmission X-ray microscopy (STXM) enable one to characterize the structure and chemical and isotopic compositions of natural materials...

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Detalles Bibliográficos
Autores principales: Gu, Lixin, Wang, Nian, Tang, Xu, Changela, H. G.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Hindawi 2020
Materias:
Review Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7397446/
https://www.ncbi.nlm.nih.gov/pubmed/32774588
http://dx.doi.org/10.1155/2020/8406917

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7397446/
https://www.ncbi.nlm.nih.gov/pubmed/32774588
http://dx.doi.org/10.1155/2020/8406917

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