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Extracting band edge profiles at semiconductor heterostructures from hard-x-ray core-level photoelectron spectra
Internal electric fields that underpin functioning of multi-component materials systems and devices are coupled to structural and compositional inhomogeneities associated with interfaces in these systems. Hard-x-ray photoelectron spectroscopy is a valuable source of information on band-edge profiles...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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Nature Publishing Group UK
2020
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7400555/ https://www.ncbi.nlm.nih.gov/pubmed/32747733 http://dx.doi.org/10.1038/s41598-020-69658-9 |