X-ray characterization of physical-vapor-transport-grown bulk AlN single crystals

AlN slices from bulk crystals grown under low thermomechanical stress conditions via the physical vapor transport (PVT) method were analyzed by X-ray methods to study the influence of the growth mode on the crystal quality. Defect types and densities were analyzed along axial [0001] as well as later...

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Detalles Bibliográficos
Autores principales: Wicht, Thomas, Müller, Stephan, Weingärtner, Roland, Epelbaum, Boris, Besendörfer, Sven, Bläß, Ulrich, Weisser, Matthias, Unruh, Tobias, Meissner, Elke
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2020
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7401779/
https://www.ncbi.nlm.nih.gov/pubmed/32788905
http://dx.doi.org/10.1107/S1600576720008961

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7401779/
https://www.ncbi.nlm.nih.gov/pubmed/32788905
http://dx.doi.org/10.1107/S1600576720008961

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