Dynamical X-ray diffraction imaging of voids in dislocation-free high-purity germanium single crystals

White-beam X-ray topography has been performed to provide direct evidence of micro-voids in dislocation-free high-purity germanium single crystals. The voids are visible because of a dynamical diffraction contrast. It is shown that voids occur only in dislocation-free parts of the crystal and do not...

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Detalles Bibliográficos
Autores principales: Gradwohl, Kevin-P., Danilewsky, Andreas N., Roder, Melissa, Schmidbauer, Martin, Janicskó-Csáthy, József, Gybin, Alexander, Abrosimov, Nikolay, Sumathi, R. Radhakrishnan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2020
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7401780/
https://www.ncbi.nlm.nih.gov/pubmed/32788899
http://dx.doi.org/10.1107/S1600576720005993

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7401780/
https://www.ncbi.nlm.nih.gov/pubmed/32788899
http://dx.doi.org/10.1107/S1600576720005993

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