Optical detection of electron spin dynamics driven by fast variations of a magnetic field: a simple method to measure [Formula: see text] , [Formula: see text] , and [Formula: see text] in semiconductors

We develop a simple method for measuring the electron spin relaxation times [Formula: see text] , [Formula: see text] and [Formula: see text] in semiconductors and demonstrate its exemplary application to n-type GaAs. Using an abrupt variation of the magnetic field acting on electron spins, we detec...

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Detalles Bibliográficos
Autores principales: Belykh, V. V., Yakovlev, D. R., Bayer, M.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7403391/
https://www.ncbi.nlm.nih.gov/pubmed/32753635
http://dx.doi.org/10.1038/s41598-020-70036-8

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7403391/
https://www.ncbi.nlm.nih.gov/pubmed/32753635
http://dx.doi.org/10.1038/s41598-020-70036-8

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