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Optical detection of electron spin dynamics driven by fast variations of a magnetic field: a simple method to measure [Formula: see text] , [Formula: see text] , and [Formula: see text] in semiconductors
We develop a simple method for measuring the electron spin relaxation times [Formula: see text] , [Formula: see text] and [Formula: see text] in semiconductors and demonstrate its exemplary application to n-type GaAs. Using an abrupt variation of the magnetic field acting on electron spins, we detec...
Autores principales: | , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2020
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7403391/ https://www.ncbi.nlm.nih.gov/pubmed/32753635 http://dx.doi.org/10.1038/s41598-020-70036-8 |
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author | Belykh, V. V. Yakovlev, D. R. Bayer, M. |
author_facet | Belykh, V. V. Yakovlev, D. R. Bayer, M. |
author_sort | Belykh, V. V. |
collection | PubMed |
description | We develop a simple method for measuring the electron spin relaxation times [Formula: see text] , [Formula: see text] and [Formula: see text] in semiconductors and demonstrate its exemplary application to n-type GaAs. Using an abrupt variation of the magnetic field acting on electron spins, we detect the spin evolution by measuring the Faraday rotation of a short laser pulse. Depending on the magnetic field orientation, this allows us to measure either the longitudinal spin relaxation time [Formula: see text] or the inhomogeneous transverse spin dephasing time [Formula: see text] . In order to determine the homogeneous spin coherence time [Formula: see text] , we apply a pulse of an oscillating radiofrequency (rf) field resonant with the Larmor frequency and detect the subsequent decay of the spin precession. The amplitude of the rf-driven spin precession is significantly enhanced upon additional optical pumping along the magnetic field. |
format | Online Article Text |
id | pubmed-7403391 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2020 |
publisher | Nature Publishing Group UK |
record_format | MEDLINE/PubMed |
spelling | pubmed-74033912020-08-07 Optical detection of electron spin dynamics driven by fast variations of a magnetic field: a simple method to measure [Formula: see text] , [Formula: see text] , and [Formula: see text] in semiconductors Belykh, V. V. Yakovlev, D. R. Bayer, M. Sci Rep Article We develop a simple method for measuring the electron spin relaxation times [Formula: see text] , [Formula: see text] and [Formula: see text] in semiconductors and demonstrate its exemplary application to n-type GaAs. Using an abrupt variation of the magnetic field acting on electron spins, we detect the spin evolution by measuring the Faraday rotation of a short laser pulse. Depending on the magnetic field orientation, this allows us to measure either the longitudinal spin relaxation time [Formula: see text] or the inhomogeneous transverse spin dephasing time [Formula: see text] . In order to determine the homogeneous spin coherence time [Formula: see text] , we apply a pulse of an oscillating radiofrequency (rf) field resonant with the Larmor frequency and detect the subsequent decay of the spin precession. The amplitude of the rf-driven spin precession is significantly enhanced upon additional optical pumping along the magnetic field. Nature Publishing Group UK 2020-08-04 /pmc/articles/PMC7403391/ /pubmed/32753635 http://dx.doi.org/10.1038/s41598-020-70036-8 Text en © The Author(s) 2020 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/. |
spellingShingle | Article Belykh, V. V. Yakovlev, D. R. Bayer, M. Optical detection of electron spin dynamics driven by fast variations of a magnetic field: a simple method to measure [Formula: see text] , [Formula: see text] , and [Formula: see text] in semiconductors |
title | Optical detection of electron spin dynamics driven by fast variations of a magnetic field: a simple method to measure [Formula: see text] , [Formula: see text] , and [Formula: see text] in semiconductors |
title_full | Optical detection of electron spin dynamics driven by fast variations of a magnetic field: a simple method to measure [Formula: see text] , [Formula: see text] , and [Formula: see text] in semiconductors |
title_fullStr | Optical detection of electron spin dynamics driven by fast variations of a magnetic field: a simple method to measure [Formula: see text] , [Formula: see text] , and [Formula: see text] in semiconductors |
title_full_unstemmed | Optical detection of electron spin dynamics driven by fast variations of a magnetic field: a simple method to measure [Formula: see text] , [Formula: see text] , and [Formula: see text] in semiconductors |
title_short | Optical detection of electron spin dynamics driven by fast variations of a magnetic field: a simple method to measure [Formula: see text] , [Formula: see text] , and [Formula: see text] in semiconductors |
title_sort | optical detection of electron spin dynamics driven by fast variations of a magnetic field: a simple method to measure [formula: see text] , [formula: see text] , and [formula: see text] in semiconductors |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7403391/ https://www.ncbi.nlm.nih.gov/pubmed/32753635 http://dx.doi.org/10.1038/s41598-020-70036-8 |
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