Revealing the local crystallinity of single silicon core–shell nanowires using tip-enhanced Raman spectroscopy

Tip-enhanced Raman spectroscopy is combined with polarization angle-resolved spectroscopy to investigate the nanometer-scale structural properties of core–shell silicon nanowires (crystalline Si core and amorphous Si shell), which were synthesized by platinum-catalyzed vapor–liquid–solid growth and...

Descripción completa

Detalles Bibliográficos
Autores principales: van den Berg, Marius, Moeinian, Ardeshir, Kobald, Arne, Chen, Yu-Ting, Horneber, Anke, Strehle, Steffen, Meixner, Alfred J, Zhang, Dai
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2020
Materias:
Full Research Paper
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7404174/
https://www.ncbi.nlm.nih.gov/pubmed/32802717
http://dx.doi.org/10.3762/bjnano.11.99

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7404174/
https://www.ncbi.nlm.nih.gov/pubmed/32802717
http://dx.doi.org/10.3762/bjnano.11.99

Ejemplares similares