Design and Characterization of a Sharp GaAs/Zn(Mn)Se Heterovalent Interface: A Sub-Nanometer Scale View

The distribution of magnetic impurities (Mn) across a GaAs/Zn(Mn)Se heterovalent interface is investigated combining three experimental techniques: Cross-Section Scanning Tunnel Microscopy (X-STM), Atom Probe Tomography (APT), and Secondary Ions Mass Spectroscopy (SIMS). This unique combination allo...

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Detalles Bibliográficos
Autores principales: Grossi, Davide F., Koelling, Sebastian, Yunin, Pavel A., Koenraad, Paul M., Klimko, Grigory V., Sorokin, Sergey V., Drozdov, Mikhail N., Ivanov, Sergey V., Toropov, Alexey A., Silov, Andrei Y.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7407323/
https://www.ncbi.nlm.nih.gov/pubmed/32635471
http://dx.doi.org/10.3390/nano10071315

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7407323/
https://www.ncbi.nlm.nih.gov/pubmed/32635471
http://dx.doi.org/10.3390/nano10071315

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