Ultralow Threshold Cavity-Free Laser Induced by Total Internal Reflection

[Image: see text] Total internal reflection is one of the most important phenomena when a propagated wave strikes a medium boundary, which possesses a wide range of applications spanning from optical communication to a fluorescence microscope. It has also been widely used to demonstrate conventional...

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Detalles Bibliográficos
Autores principales: Hu, Han-Wen, Haider, Golam, Liao, Yu-Ming, Roy, Pradip Kumar, Lin, Hung-I., Lin, Shih-Yao, Chen, Yang-Fang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2020
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7407540/
https://www.ncbi.nlm.nih.gov/pubmed/32775855
http://dx.doi.org/10.1021/acsomega.9b04094

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7407540/
https://www.ncbi.nlm.nih.gov/pubmed/32775855
http://dx.doi.org/10.1021/acsomega.9b04094

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