Piezoelectric Properties of Pb(1−x)La(x)(Zr(0.52)Ti(0.48))(1−x/4)O(3) Thin Films Studied by In Situ X-ray Diffraction

The piezoelectric properties of lanthanum-modified lead zirconate titanate Pb(1−x)La(x)(Zr(0.52)Ti(0.48))(1−x/4)O(3) thin films, with x = 0, 3 and 12 mol% La, were studied by in situ synchrotron X-ray diffraction under direct (DC) and alternating (AC) electric fields, with AC frequencies covering mo...

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Detalles Bibliográficos
Autores principales: Cornelius, Thomas W., Mocuta, Cristian, Escoubas, Stéphanie, Lima, Luiz R. M., Araújo, Eudes B., Kholkin, Andrei L., Thomas, Olivier
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7435409/
https://www.ncbi.nlm.nih.gov/pubmed/32727047
http://dx.doi.org/10.3390/ma13153338

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7435409/
https://www.ncbi.nlm.nih.gov/pubmed/32727047
http://dx.doi.org/10.3390/ma13153338

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