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Piezoelectric Properties of Pb(1−x)La(x)(Zr(0.52)Ti(0.48))(1−x/4)O(3) Thin Films Studied by In Situ X-ray Diffraction

The piezoelectric properties of lanthanum-modified lead zirconate titanate Pb(1−x)La(x)(Zr(0.52)Ti(0.48))(1−x/4)O(3) thin films, with x = 0, 3 and 12 mol% La, were studied by in situ synchrotron X-ray diffraction under direct (DC) and alternating (AC) electric fields, with AC frequencies covering mo...

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Autores principales: Cornelius, Thomas W., Mocuta, Cristian, Escoubas, Stéphanie, Lima, Luiz R. M., Araújo, Eudes B., Kholkin, Andrei L., Thomas, Olivier
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7435409/
https://www.ncbi.nlm.nih.gov/pubmed/32727047
http://dx.doi.org/10.3390/ma13153338
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author Cornelius, Thomas W.
Mocuta, Cristian
Escoubas, Stéphanie
Lima, Luiz R. M.
Araújo, Eudes B.
Kholkin, Andrei L.
Thomas, Olivier
author_facet Cornelius, Thomas W.
Mocuta, Cristian
Escoubas, Stéphanie
Lima, Luiz R. M.
Araújo, Eudes B.
Kholkin, Andrei L.
Thomas, Olivier
author_sort Cornelius, Thomas W.
collection PubMed
description The piezoelectric properties of lanthanum-modified lead zirconate titanate Pb(1−x)La(x)(Zr(0.52)Ti(0.48))(1−x/4)O(3) thin films, with x = 0, 3 and 12 mol% La, were studied by in situ synchrotron X-ray diffraction under direct (DC) and alternating (AC) electric fields, with AC frequencies covering more than four orders of magnitude. The Bragg reflections for thin films with low lanthanum concentration exhibit a double-peak structure, indicating two contributions, whereas thin films with 12% La possess a well-defined Bragg peak with a single component. In addition, built-in electric fields are revealed for low La concentrations, while they are absent for thin films with 12% of La. For static and low frequency AC electric fields, all lanthanum-modified lead zirconate titanate thin films exhibit butterfly loops, whereas linear piezoelectric behavior is found for AC frequencies larger than 1 Hz.
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spelling pubmed-74354092020-08-28 Piezoelectric Properties of Pb(1−x)La(x)(Zr(0.52)Ti(0.48))(1−x/4)O(3) Thin Films Studied by In Situ X-ray Diffraction Cornelius, Thomas W. Mocuta, Cristian Escoubas, Stéphanie Lima, Luiz R. M. Araújo, Eudes B. Kholkin, Andrei L. Thomas, Olivier Materials (Basel) Article The piezoelectric properties of lanthanum-modified lead zirconate titanate Pb(1−x)La(x)(Zr(0.52)Ti(0.48))(1−x/4)O(3) thin films, with x = 0, 3 and 12 mol% La, were studied by in situ synchrotron X-ray diffraction under direct (DC) and alternating (AC) electric fields, with AC frequencies covering more than four orders of magnitude. The Bragg reflections for thin films with low lanthanum concentration exhibit a double-peak structure, indicating two contributions, whereas thin films with 12% La possess a well-defined Bragg peak with a single component. In addition, built-in electric fields are revealed for low La concentrations, while they are absent for thin films with 12% of La. For static and low frequency AC electric fields, all lanthanum-modified lead zirconate titanate thin films exhibit butterfly loops, whereas linear piezoelectric behavior is found for AC frequencies larger than 1 Hz. MDPI 2020-07-27 /pmc/articles/PMC7435409/ /pubmed/32727047 http://dx.doi.org/10.3390/ma13153338 Text en © 2020 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Cornelius, Thomas W.
Mocuta, Cristian
Escoubas, Stéphanie
Lima, Luiz R. M.
Araújo, Eudes B.
Kholkin, Andrei L.
Thomas, Olivier
Piezoelectric Properties of Pb(1−x)La(x)(Zr(0.52)Ti(0.48))(1−x/4)O(3) Thin Films Studied by In Situ X-ray Diffraction
title Piezoelectric Properties of Pb(1−x)La(x)(Zr(0.52)Ti(0.48))(1−x/4)O(3) Thin Films Studied by In Situ X-ray Diffraction
title_full Piezoelectric Properties of Pb(1−x)La(x)(Zr(0.52)Ti(0.48))(1−x/4)O(3) Thin Films Studied by In Situ X-ray Diffraction
title_fullStr Piezoelectric Properties of Pb(1−x)La(x)(Zr(0.52)Ti(0.48))(1−x/4)O(3) Thin Films Studied by In Situ X-ray Diffraction
title_full_unstemmed Piezoelectric Properties of Pb(1−x)La(x)(Zr(0.52)Ti(0.48))(1−x/4)O(3) Thin Films Studied by In Situ X-ray Diffraction
title_short Piezoelectric Properties of Pb(1−x)La(x)(Zr(0.52)Ti(0.48))(1−x/4)O(3) Thin Films Studied by In Situ X-ray Diffraction
title_sort piezoelectric properties of pb(1−x)la(x)(zr(0.52)ti(0.48))(1−x/4)o(3) thin films studied by in situ x-ray diffraction
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7435409/
https://www.ncbi.nlm.nih.gov/pubmed/32727047
http://dx.doi.org/10.3390/ma13153338
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