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Piezoelectric Properties of Pb(1−x)La(x)(Zr(0.52)Ti(0.48))(1−x/4)O(3) Thin Films Studied by In Situ X-ray Diffraction
The piezoelectric properties of lanthanum-modified lead zirconate titanate Pb(1−x)La(x)(Zr(0.52)Ti(0.48))(1−x/4)O(3) thin films, with x = 0, 3 and 12 mol% La, were studied by in situ synchrotron X-ray diffraction under direct (DC) and alternating (AC) electric fields, with AC frequencies covering mo...
Autores principales: | , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2020
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7435409/ https://www.ncbi.nlm.nih.gov/pubmed/32727047 http://dx.doi.org/10.3390/ma13153338 |
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author | Cornelius, Thomas W. Mocuta, Cristian Escoubas, Stéphanie Lima, Luiz R. M. Araújo, Eudes B. Kholkin, Andrei L. Thomas, Olivier |
author_facet | Cornelius, Thomas W. Mocuta, Cristian Escoubas, Stéphanie Lima, Luiz R. M. Araújo, Eudes B. Kholkin, Andrei L. Thomas, Olivier |
author_sort | Cornelius, Thomas W. |
collection | PubMed |
description | The piezoelectric properties of lanthanum-modified lead zirconate titanate Pb(1−x)La(x)(Zr(0.52)Ti(0.48))(1−x/4)O(3) thin films, with x = 0, 3 and 12 mol% La, were studied by in situ synchrotron X-ray diffraction under direct (DC) and alternating (AC) electric fields, with AC frequencies covering more than four orders of magnitude. The Bragg reflections for thin films with low lanthanum concentration exhibit a double-peak structure, indicating two contributions, whereas thin films with 12% La possess a well-defined Bragg peak with a single component. In addition, built-in electric fields are revealed for low La concentrations, while they are absent for thin films with 12% of La. For static and low frequency AC electric fields, all lanthanum-modified lead zirconate titanate thin films exhibit butterfly loops, whereas linear piezoelectric behavior is found for AC frequencies larger than 1 Hz. |
format | Online Article Text |
id | pubmed-7435409 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2020 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-74354092020-08-28 Piezoelectric Properties of Pb(1−x)La(x)(Zr(0.52)Ti(0.48))(1−x/4)O(3) Thin Films Studied by In Situ X-ray Diffraction Cornelius, Thomas W. Mocuta, Cristian Escoubas, Stéphanie Lima, Luiz R. M. Araújo, Eudes B. Kholkin, Andrei L. Thomas, Olivier Materials (Basel) Article The piezoelectric properties of lanthanum-modified lead zirconate titanate Pb(1−x)La(x)(Zr(0.52)Ti(0.48))(1−x/4)O(3) thin films, with x = 0, 3 and 12 mol% La, were studied by in situ synchrotron X-ray diffraction under direct (DC) and alternating (AC) electric fields, with AC frequencies covering more than four orders of magnitude. The Bragg reflections for thin films with low lanthanum concentration exhibit a double-peak structure, indicating two contributions, whereas thin films with 12% La possess a well-defined Bragg peak with a single component. In addition, built-in electric fields are revealed for low La concentrations, while they are absent for thin films with 12% of La. For static and low frequency AC electric fields, all lanthanum-modified lead zirconate titanate thin films exhibit butterfly loops, whereas linear piezoelectric behavior is found for AC frequencies larger than 1 Hz. MDPI 2020-07-27 /pmc/articles/PMC7435409/ /pubmed/32727047 http://dx.doi.org/10.3390/ma13153338 Text en © 2020 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Cornelius, Thomas W. Mocuta, Cristian Escoubas, Stéphanie Lima, Luiz R. M. Araújo, Eudes B. Kholkin, Andrei L. Thomas, Olivier Piezoelectric Properties of Pb(1−x)La(x)(Zr(0.52)Ti(0.48))(1−x/4)O(3) Thin Films Studied by In Situ X-ray Diffraction |
title | Piezoelectric Properties of Pb(1−x)La(x)(Zr(0.52)Ti(0.48))(1−x/4)O(3) Thin Films Studied by In Situ X-ray Diffraction |
title_full | Piezoelectric Properties of Pb(1−x)La(x)(Zr(0.52)Ti(0.48))(1−x/4)O(3) Thin Films Studied by In Situ X-ray Diffraction |
title_fullStr | Piezoelectric Properties of Pb(1−x)La(x)(Zr(0.52)Ti(0.48))(1−x/4)O(3) Thin Films Studied by In Situ X-ray Diffraction |
title_full_unstemmed | Piezoelectric Properties of Pb(1−x)La(x)(Zr(0.52)Ti(0.48))(1−x/4)O(3) Thin Films Studied by In Situ X-ray Diffraction |
title_short | Piezoelectric Properties of Pb(1−x)La(x)(Zr(0.52)Ti(0.48))(1−x/4)O(3) Thin Films Studied by In Situ X-ray Diffraction |
title_sort | piezoelectric properties of pb(1−x)la(x)(zr(0.52)ti(0.48))(1−x/4)o(3) thin films studied by in situ x-ray diffraction |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7435409/ https://www.ncbi.nlm.nih.gov/pubmed/32727047 http://dx.doi.org/10.3390/ma13153338 |
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