Influence of Surface and Bulk Defects on Contactless Resistivity Measurements of CdTe and Related Compounds

We analyzed the influence of parameters of deep levels in the bulk and conditions on the surface on transient charge responses of semi-insulating samples (CdTe and GaAs). We studied the dependence on the applied bias step used for the experimental evaluation of resistivity in contactless measurement...

Descripción completa

Detalles Bibliográficos
Autores principales: Franc, Jan, Grill, Roman, Zázvorka, Jakub
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Letter
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7435808/
https://www.ncbi.nlm.nih.gov/pubmed/32759802
http://dx.doi.org/10.3390/s20154347

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7435808/
https://www.ncbi.nlm.nih.gov/pubmed/32759802
http://dx.doi.org/10.3390/s20154347

Ejemplares similares