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Ferroelectricity in Si-Doped Hafnia: Probing Challenges in Absence of Screening Charges
The ability to develop ferroelectric materials using binary oxides is critical to enable novel low-power, high-density non-volatile memory and fast switching logic. The discovery of ferroelectricity in hafnia-based thin films, has focused the hopes of the community on this class of materials to over...
Autores principales: | , , , , , , , , , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2020
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7466465/ https://www.ncbi.nlm.nih.gov/pubmed/32796703 http://dx.doi.org/10.3390/nano10081576 |