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On-demand correction for X-ray response non-uniformity in microstrip detectors by a data-driven approach
A statistical approach, which was previously developed to correct scattering data for X-ray response non-uniformity (XRNU) in microstrip detectors, has been improved to significantly reduce the correcting time. The improved algorithm has succeeded in increasing the utilization rate of data acquired...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
International Union of Crystallography
2020
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7467352/ https://www.ncbi.nlm.nih.gov/pubmed/32876591 http://dx.doi.org/10.1107/S1600577520008929 |