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On-demand correction for X-ray response non-uniformity in microstrip detectors by a data-driven approach
A statistical approach, which was previously developed to correct scattering data for X-ray response non-uniformity (XRNU) in microstrip detectors, has been improved to significantly reduce the correcting time. The improved algorithm has succeeded in increasing the utilization rate of data acquired...
Autores principales: | , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
International Union of Crystallography
2020
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7467352/ https://www.ncbi.nlm.nih.gov/pubmed/32876591 http://dx.doi.org/10.1107/S1600577520008929 |
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author | Kato, Kenichi Shigeta, Kazuya |
author_facet | Kato, Kenichi Shigeta, Kazuya |
author_sort | Kato, Kenichi |
collection | PubMed |
description | A statistical approach, which was previously developed to correct scattering data for X-ray response non-uniformity (XRNU) in microstrip detectors, has been improved to significantly reduce the correcting time. The improved algorithm has succeeded in increasing the utilization rate of data acquired for reference intensity to 98%. As a result, the correcting time was reduced from half a day to half an hour, which was shorter than the typical measuring time of a sample. Moreover, the present approach was found to yield better correction results than the previous one. The data-driven approach enabled the on-demand correction for XRNU according to the detector and experimental settings. The present study will encourage the correction of scattering data for XRNU in area detectors. |
format | Online Article Text |
id | pubmed-7467352 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2020 |
publisher | International Union of Crystallography |
record_format | MEDLINE/PubMed |
spelling | pubmed-74673522020-09-15 On-demand correction for X-ray response non-uniformity in microstrip detectors by a data-driven approach Kato, Kenichi Shigeta, Kazuya J Synchrotron Radiat Research Papers A statistical approach, which was previously developed to correct scattering data for X-ray response non-uniformity (XRNU) in microstrip detectors, has been improved to significantly reduce the correcting time. The improved algorithm has succeeded in increasing the utilization rate of data acquired for reference intensity to 98%. As a result, the correcting time was reduced from half a day to half an hour, which was shorter than the typical measuring time of a sample. Moreover, the present approach was found to yield better correction results than the previous one. The data-driven approach enabled the on-demand correction for XRNU according to the detector and experimental settings. The present study will encourage the correction of scattering data for XRNU in area detectors. International Union of Crystallography 2020-08-11 /pmc/articles/PMC7467352/ /pubmed/32876591 http://dx.doi.org/10.1107/S1600577520008929 Text en © Kato and Shigeta 2020 http://creativecommons.org/licenses/by/4.0/ This is an open-access article distributed under the terms of the Creative Commons Attribution (CC-BY) Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.http://creativecommons.org/licenses/by/4.0/ |
spellingShingle | Research Papers Kato, Kenichi Shigeta, Kazuya On-demand correction for X-ray response non-uniformity in microstrip detectors by a data-driven approach |
title | On-demand correction for X-ray response non-uniformity in microstrip detectors by a data-driven approach |
title_full | On-demand correction for X-ray response non-uniformity in microstrip detectors by a data-driven approach |
title_fullStr | On-demand correction for X-ray response non-uniformity in microstrip detectors by a data-driven approach |
title_full_unstemmed | On-demand correction for X-ray response non-uniformity in microstrip detectors by a data-driven approach |
title_short | On-demand correction for X-ray response non-uniformity in microstrip detectors by a data-driven approach |
title_sort | on-demand correction for x-ray response non-uniformity in microstrip detectors by a data-driven approach |
topic | Research Papers |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7467352/ https://www.ncbi.nlm.nih.gov/pubmed/32876591 http://dx.doi.org/10.1107/S1600577520008929 |
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