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Surface Characterization of MoS(2) Atomic Layers Mechanically Exfoliated on a Si Substrate
Mo disulfide overlayers with the thickness exceeding 1.77 nm were obtained on Si substrates through mechanical exfoliation. The resulting Mo disulfide flakes were then analyzed ex situ using combination of Auger electron spectroscopy (AES), elastic-peak electron spectroscopy (EPES) and scanning elec...
Autores principales: | , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2020
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7475815/ https://www.ncbi.nlm.nih.gov/pubmed/32823911 http://dx.doi.org/10.3390/ma13163595 |