Cargando…

How levelling and scan line corrections ruin roughness measurement and how to prevent it

Surface roughness plays an important role in various fields of nanoscience and nanotechnology. However, the present practices in roughness measurements, typically based on some Atomic Force Microscopy measurements for nanometric roughness or optical or mechanical profilometry for larger scale roughn...

Descripción completa

Detalles Bibliográficos
Autores principales: Nečas, David, Valtr, Miroslav, Klapetek, Petr
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7499267/
https://www.ncbi.nlm.nih.gov/pubmed/32943693
http://dx.doi.org/10.1038/s41598-020-72171-8