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How levelling and scan line corrections ruin roughness measurement and how to prevent it
Surface roughness plays an important role in various fields of nanoscience and nanotechnology. However, the present practices in roughness measurements, typically based on some Atomic Force Microscopy measurements for nanometric roughness or optical or mechanical profilometry for larger scale roughn...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2020
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7499267/ https://www.ncbi.nlm.nih.gov/pubmed/32943693 http://dx.doi.org/10.1038/s41598-020-72171-8 |