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Schottky barrier inhomogeneities at the interface of different epitaxial layer thicknesses of n-GaAs/Ti/Au/Si: Al(0.33)Ga(0.67)As

The effects of an epitaxial layer on the rectifying behavior of n-GaAs/Ti/Au/Si:Al(0.33)Ga(0.67) As diodes have been examined through the inhomogeneity model on n(+)-GaAs substrate with orientation. The electrical properties and conduction mechanism of these materials were understood through theoret...

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Autor principal: Al-Ahmadi, Noorah Ahmed
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Elsevier 2020
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7502344/
https://www.ncbi.nlm.nih.gov/pubmed/32995595
http://dx.doi.org/10.1016/j.heliyon.2020.e04852
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author Al-Ahmadi, Noorah Ahmed
author_facet Al-Ahmadi, Noorah Ahmed
author_sort Al-Ahmadi, Noorah Ahmed
collection PubMed
description The effects of an epitaxial layer on the rectifying behavior of n-GaAs/Ti/Au/Si:Al(0.33)Ga(0.67) As diodes have been examined through the inhomogeneity model on n(+)-GaAs substrate with orientation. The electrical properties and conduction mechanism of these materials were understood through theoretical models. The inhomogeneity model was used to electrical behavior of these diodes was explained. The barrier height inhomogeneity model reveals a 13% and 15% barrier height inhomogeneity in N1 and N2 Schottky diodes, respectively. The ideal thermionic emission behavior increases the ideality factors and reduces barrier heights. Within the entire temperature range, the effective Schottky barrier for a thin epitaxial layer was higher. Such results depicted the presence of defects in the thick layer, which decreased the barrier height and ultimately degraded diode performance. The thermionic emission theory along with Gaussian distribution of barrier heights is explained by the temperature dependence of the forward bias current-voltage-temperature (I-V-T) features.
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spelling pubmed-75023442020-09-28 Schottky barrier inhomogeneities at the interface of different epitaxial layer thicknesses of n-GaAs/Ti/Au/Si: Al(0.33)Ga(0.67)As Al-Ahmadi, Noorah Ahmed Heliyon Research Article The effects of an epitaxial layer on the rectifying behavior of n-GaAs/Ti/Au/Si:Al(0.33)Ga(0.67) As diodes have been examined through the inhomogeneity model on n(+)-GaAs substrate with orientation. The electrical properties and conduction mechanism of these materials were understood through theoretical models. The inhomogeneity model was used to electrical behavior of these diodes was explained. The barrier height inhomogeneity model reveals a 13% and 15% barrier height inhomogeneity in N1 and N2 Schottky diodes, respectively. The ideal thermionic emission behavior increases the ideality factors and reduces barrier heights. Within the entire temperature range, the effective Schottky barrier for a thin epitaxial layer was higher. Such results depicted the presence of defects in the thick layer, which decreased the barrier height and ultimately degraded diode performance. The thermionic emission theory along with Gaussian distribution of barrier heights is explained by the temperature dependence of the forward bias current-voltage-temperature (I-V-T) features. Elsevier 2020-09-16 /pmc/articles/PMC7502344/ /pubmed/32995595 http://dx.doi.org/10.1016/j.heliyon.2020.e04852 Text en © 2020 The Author http://creativecommons.org/licenses/by-nc-nd/4.0/ This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/).
spellingShingle Research Article
Al-Ahmadi, Noorah Ahmed
Schottky barrier inhomogeneities at the interface of different epitaxial layer thicknesses of n-GaAs/Ti/Au/Si: Al(0.33)Ga(0.67)As
title Schottky barrier inhomogeneities at the interface of different epitaxial layer thicknesses of n-GaAs/Ti/Au/Si: Al(0.33)Ga(0.67)As
title_full Schottky barrier inhomogeneities at the interface of different epitaxial layer thicknesses of n-GaAs/Ti/Au/Si: Al(0.33)Ga(0.67)As
title_fullStr Schottky barrier inhomogeneities at the interface of different epitaxial layer thicknesses of n-GaAs/Ti/Au/Si: Al(0.33)Ga(0.67)As
title_full_unstemmed Schottky barrier inhomogeneities at the interface of different epitaxial layer thicknesses of n-GaAs/Ti/Au/Si: Al(0.33)Ga(0.67)As
title_short Schottky barrier inhomogeneities at the interface of different epitaxial layer thicknesses of n-GaAs/Ti/Au/Si: Al(0.33)Ga(0.67)As
title_sort schottky barrier inhomogeneities at the interface of different epitaxial layer thicknesses of n-gaas/ti/au/si: al(0.33)ga(0.67)as
topic Research Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7502344/
https://www.ncbi.nlm.nih.gov/pubmed/32995595
http://dx.doi.org/10.1016/j.heliyon.2020.e04852
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