A Novel Inspection Technique for Electronic Components Using Thermography (NITECT)

Unverified or counterfeited electronic components pose a big threat globally because they could lead to malfunction of safety-critical systems and reduced reliability of high-hazard assets. The current inspection techniques are either expensive or slow, which becomes the bottleneck of large volume i...

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Detalles Bibliográficos
Autores principales: Liu, Haochen, Tinsley, Lawrence, Lam, Wayne, Addepalli, Sri, Liu, Xiaochen, Starr, Andrew, Zhao, Yifan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7506598/
https://www.ncbi.nlm.nih.gov/pubmed/32899391
http://dx.doi.org/10.3390/s20175013

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7506598/
https://www.ncbi.nlm.nih.gov/pubmed/32899391
http://dx.doi.org/10.3390/s20175013

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