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A Novel Inspection Technique for Electronic Components Using Thermography (NITECT)
Unverified or counterfeited electronic components pose a big threat globally because they could lead to malfunction of safety-critical systems and reduced reliability of high-hazard assets. The current inspection techniques are either expensive or slow, which becomes the bottleneck of large volume i...
| Autores principales: | , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2020
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7506598/ https://www.ncbi.nlm.nih.gov/pubmed/32899391 http://dx.doi.org/10.3390/s20175013 |