Review: Cantilever-Based Sensors for High Speed Atomic Force Microscopy

This review critically summarizes the recent advances of the microcantilever-based force sensors for atomic force microscope (AFM) applications. They are one the most common mechanical spring–mass systems and are extremely sensitive to changes in the resonant frequency, thus finding numerous applica...

Descripción completa

Detalles Bibliográficos
Autores principales: Alunda, Bernard Ouma, Lee, Yong Joong
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Review
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7506678/
https://www.ncbi.nlm.nih.gov/pubmed/32854193
http://dx.doi.org/10.3390/s20174784

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7506678/
https://www.ncbi.nlm.nih.gov/pubmed/32854193
http://dx.doi.org/10.3390/s20174784

Ejemplares similares