Scan-Chain-Fault Diagnosis Using Regressions in Cryptographic Chips for Wireless Sensor Networks

Scan structures, which are widely used in cryptographic circuits for wireless sensor networks applications, are essential for testing very-large-scale integration (VLSI) circuits. Faults in cryptographic circuits can be effectively screened out by improving testability and test coverage using a scan...

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Detalles Bibliográficos
Autores principales: Lim, Hyunyul, Cheong, Minho, Kang, Sungho
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7506763/
https://www.ncbi.nlm.nih.gov/pubmed/32846955
http://dx.doi.org/10.3390/s20174771

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7506763/
https://www.ncbi.nlm.nih.gov/pubmed/32846955
http://dx.doi.org/10.3390/s20174771

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