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Scan-Chain-Fault Diagnosis Using Regressions in Cryptographic Chips for Wireless Sensor Networks
Scan structures, which are widely used in cryptographic circuits for wireless sensor networks applications, are essential for testing very-large-scale integration (VLSI) circuits. Faults in cryptographic circuits can be effectively screened out by improving testability and test coverage using a scan...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2020
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7506763/ https://www.ncbi.nlm.nih.gov/pubmed/32846955 http://dx.doi.org/10.3390/s20174771 |