Analog Circuit Fault Diagnosis via Joint Cross-Wavelet Singular Entropy and Parametric t-SNE

In this paper, a novel method with cross-wavelet singular entropy (XWSE)-based feature extractor and support vector machine (SVM) is proposed for analog circuit fault diagnosis. Primarily, cross-wavelet transform (XWT), which possesses a good capability to restrain the environment noise, is applied...

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Detalles Bibliográficos
Autores principales: He, Wei, He, Yigang, Li, Bing, Zhang, Chaolong
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2018
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7513130/
https://www.ncbi.nlm.nih.gov/pubmed/33265693
http://dx.doi.org/10.3390/e20080604

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7513130/
https://www.ncbi.nlm.nih.gov/pubmed/33265693
http://dx.doi.org/10.3390/e20080604

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