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Analog Circuit Fault Diagnosis via Joint Cross-Wavelet Singular Entropy and Parametric t-SNE
In this paper, a novel method with cross-wavelet singular entropy (XWSE)-based feature extractor and support vector machine (SVM) is proposed for analog circuit fault diagnosis. Primarily, cross-wavelet transform (XWT), which possesses a good capability to restrain the environment noise, is applied...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2018
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7513130/ https://www.ncbi.nlm.nih.gov/pubmed/33265693 http://dx.doi.org/10.3390/e20080604 |