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Epifluorescence-based three-dimensional traction force microscopy

We introduce a novel method to compute three-dimensional (3D) displacements and both in-plane and out-of-plane tractions on nominally planar transparent materials using standard epifluorescence microscopy. Despite the importance of out-of-plane components to fully understanding cell behavior, epiflu...

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Detalles Bibliográficos
Autores principales: Hazlett, Lauren, Landauer, Alexander K., Patel, Mohak, Witt, Hadley A., Yang, Jin, Reichner, Jonathan S., Franck, Christian
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7538907/
https://www.ncbi.nlm.nih.gov/pubmed/33024138
http://dx.doi.org/10.1038/s41598-020-72931-6