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Aqueous ionic effect on electrochemical breakdown of Si-dielectric–electrolyte interface

The breakdown of thin dielectric films (SiO(2), Si(3)N(4), HfO(2)) immersed in aqueous electrolyte was investigated. The current and the kinetics of dielectric breakdown caused by large cathodic electric field applied across the dielectric layer reveal the electrochemical nature of dielectric materi...

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Detalles Bibliográficos
Autores principales: Yun, Jeongse, Lee, Jae Gyeong, Oh, Kyungbae, Kang, Kisuk, Chung, Taek Dong
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7544892/
https://www.ncbi.nlm.nih.gov/pubmed/33033305
http://dx.doi.org/10.1038/s41598-020-73880-w