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Aqueous ionic effect on electrochemical breakdown of Si-dielectric–electrolyte interface

The breakdown of thin dielectric films (SiO(2), Si(3)N(4), HfO(2)) immersed in aqueous electrolyte was investigated. The current and the kinetics of dielectric breakdown caused by large cathodic electric field applied across the dielectric layer reveal the electrochemical nature of dielectric materi...

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Autores principales: Yun, Jeongse, Lee, Jae Gyeong, Oh, Kyungbae, Kang, Kisuk, Chung, Taek Dong
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7544892/
https://www.ncbi.nlm.nih.gov/pubmed/33033305
http://dx.doi.org/10.1038/s41598-020-73880-w
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author Yun, Jeongse
Lee, Jae Gyeong
Oh, Kyungbae
Kang, Kisuk
Chung, Taek Dong
author_facet Yun, Jeongse
Lee, Jae Gyeong
Oh, Kyungbae
Kang, Kisuk
Chung, Taek Dong
author_sort Yun, Jeongse
collection PubMed
description The breakdown of thin dielectric films (SiO(2), Si(3)N(4), HfO(2)) immersed in aqueous electrolyte was investigated. The current and the kinetics of dielectric breakdown caused by large cathodic electric field applied across the dielectric layer reveal the electrochemical nature of dielectric materials. Electrolytes play a huge role in the established dielectric-electrolyte interface with respect to the overall electrical behavior of the system. Although aqueous cations are considered as spectator ions in most electrochemical systems, in dielectric interfaces the current–potential characteristics depend on the type of cation. Computer simulation based on density functional theory and molecular dynamics showed cations affect the dielectric strength. The responses of various dielectric films to solution components provide invaluable information for dielectric-incorporated electrochemical systems.
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spelling pubmed-75448922020-10-14 Aqueous ionic effect on electrochemical breakdown of Si-dielectric–electrolyte interface Yun, Jeongse Lee, Jae Gyeong Oh, Kyungbae Kang, Kisuk Chung, Taek Dong Sci Rep Article The breakdown of thin dielectric films (SiO(2), Si(3)N(4), HfO(2)) immersed in aqueous electrolyte was investigated. The current and the kinetics of dielectric breakdown caused by large cathodic electric field applied across the dielectric layer reveal the electrochemical nature of dielectric materials. Electrolytes play a huge role in the established dielectric-electrolyte interface with respect to the overall electrical behavior of the system. Although aqueous cations are considered as spectator ions in most electrochemical systems, in dielectric interfaces the current–potential characteristics depend on the type of cation. Computer simulation based on density functional theory and molecular dynamics showed cations affect the dielectric strength. The responses of various dielectric films to solution components provide invaluable information for dielectric-incorporated electrochemical systems. Nature Publishing Group UK 2020-10-08 /pmc/articles/PMC7544892/ /pubmed/33033305 http://dx.doi.org/10.1038/s41598-020-73880-w Text en © The Author(s) 2020 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if changes were made. The images or other third party material in this article are included in the article's Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article's Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/.
spellingShingle Article
Yun, Jeongse
Lee, Jae Gyeong
Oh, Kyungbae
Kang, Kisuk
Chung, Taek Dong
Aqueous ionic effect on electrochemical breakdown of Si-dielectric–electrolyte interface
title Aqueous ionic effect on electrochemical breakdown of Si-dielectric–electrolyte interface
title_full Aqueous ionic effect on electrochemical breakdown of Si-dielectric–electrolyte interface
title_fullStr Aqueous ionic effect on electrochemical breakdown of Si-dielectric–electrolyte interface
title_full_unstemmed Aqueous ionic effect on electrochemical breakdown of Si-dielectric–electrolyte interface
title_short Aqueous ionic effect on electrochemical breakdown of Si-dielectric–electrolyte interface
title_sort aqueous ionic effect on electrochemical breakdown of si-dielectric–electrolyte interface
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7544892/
https://www.ncbi.nlm.nih.gov/pubmed/33033305
http://dx.doi.org/10.1038/s41598-020-73880-w
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