Investigation of the Effect of Magnification, Accelerating Voltage, and Working Distance on the 3D Digital Reconstruction Techniques

In this study, the effect of Scanning Electron Microscopy (SEM) parameters such as magnification (M), accelerating voltage (V), and working distance (WD) on the 3D digital reconstruction technique, as the first step of the quantitative characterization of fracture surfaces with SEM, was investigated...

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Detalles Bibliográficos
Autores principales: Bayazid, Seyed Mahmoud, Brodusch, Nicolas, Gauvin, Raynald
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Hindawi 2020
Materias:
Research Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7545473/
https://www.ncbi.nlm.nih.gov/pubmed/33082905
http://dx.doi.org/10.1155/2020/3743267

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7545473/
https://www.ncbi.nlm.nih.gov/pubmed/33082905
http://dx.doi.org/10.1155/2020/3743267

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