Atomic Force Microscope Study of Ag-Conduct Polymer Hybrid Films: Evidence for Light-Induced Charge Separation

Scanning Kelvin probe microscopy (SKPM), electrostatic force microscopy (EFM) are used to study the microscopic processes of the photo-induced charge separation at the interface of Ag and conductive polymers, i.e., poly[2,6-(4,4-bis-(2-ethylhexyl)-4H-cyclopenta[2,1-b;3,4-bʹ]dithiophene)-alt-4,7-(2,1...

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Detalles Bibliográficos
Autores principales: Wu, Yinghui, Wang, Dong, Liu, Jinyuan, Cai, Houzhi, Zhang, Yueqiang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7558113/
https://www.ncbi.nlm.nih.gov/pubmed/32932650
http://dx.doi.org/10.3390/nano10091819

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7558113/
https://www.ncbi.nlm.nih.gov/pubmed/32932650
http://dx.doi.org/10.3390/nano10091819

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