Fast, Nondestructive, and Broadband Dielectric Characterization for Polymer Sheets

We propose a compact nearfield scheme for fast and broadband dielectric characterization in the microwave region. An open-type circular probe operated in the high-purity TE(01) mode was developed, showing a strongly confined fringing field at the open end. This fringing field directly probed the fre...

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Detalles Bibliográficos
Autores principales: Yao, Hsin-Yu, Hsiao, Dan-Ru, Chang, Tsun-Hsu
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7565126/
https://www.ncbi.nlm.nih.gov/pubmed/32839406
http://dx.doi.org/10.3390/polym12091891

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7565126/
https://www.ncbi.nlm.nih.gov/pubmed/32839406
http://dx.doi.org/10.3390/polym12091891

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