Conduction Band Edge Energy Profile Probed by Hall Offset Voltage in InGaZnO Thin Films

We measured and analyzed the Hall offset voltages in InGaZnO thin-film transistors. The Hall offset voltages were found to decrease monotonously as the electron densities increased. We attributed the magnitude of the offset voltage to the misalignment in the longitudinal distance between the probing...

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Detalles Bibliográficos
Autores principales: Joo, Hyo-Jun, Kim, Dae-Hwan, Cha, Hyun-Seok, Song, Sang-Hun
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Communication
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7569786/
https://www.ncbi.nlm.nih.gov/pubmed/32872581
http://dx.doi.org/10.3390/mi11090822

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7569786/
https://www.ncbi.nlm.nih.gov/pubmed/32872581
http://dx.doi.org/10.3390/mi11090822

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