Cargando…
Avalanche Transients of Thick 0.35 µm CMOS Single-Photon Avalanche Diodes
Two types of single-photon avalanche diodes (SPADs) with different diameters are investigated regarding their avalanche behavior. SPAD type A was designed in standard 0.35-µm complementary metal-oxide-semiconductor (CMOS) including a 12-µm thick p(-) epi-layer with diameters of 50, 100, 200, and 400...
Autores principales: | Goll, Bernhard, Steindl, Bernhard, Zimmermann, Horst |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2020
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7569859/ https://www.ncbi.nlm.nih.gov/pubmed/32961756 http://dx.doi.org/10.3390/mi11090869 |
Ejemplares similares
-
Area and Bandwidth Enhancement of an n(+)/p-Well Dot Avalanche Photodiode in 0.35 μm CMOS Technology
por: Kohneh Poushi, Seyed Saman, et al.
Publicado: (2023) -
Indirect Time-of-Flight with GHz Correlation Frequency and Integrated SPAD Reaching Sub-100 µm Precision in 0.35 µm CMOS
por: Hauser, Michael, et al.
Publicado: (2023) -
Photon-Detection-Probability Simulation Method for CMOS Single-Photon Avalanche Diodes
por: Hsieh, Chin-An, et al.
Publicado: (2020) -
Analytical Evaluation of Signal-to-Noise Ratios for Avalanche- and Single-Photon Avalanche Diodes
por: Buchner, Andre, et al.
Publicado: (2021) -
Zener and avalanche diodes
por: Todd, Carl David
Publicado: (1970)