Influence of plasmon excitations on atomic-resolution quantitative 4D scanning transmission electron microscopy

Scanning transmission electron microscopy (STEM) allows to gain quantitative information on the atomic-scale structure and composition of materials, satisfying one of todays major needs in the development of novel nanoscale devices. The aim of this study is to quantify the impact of inelastic, i.e....

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Detalles Bibliográficos
Autores principales: Beyer, Andreas, Krause, Florian F., Robert, Hoel L., Firoozabadi, Saleh, Grieb, Tim, Kükelhan, Pirmin, Heimes, Damien, Schowalter, Marco, Müller-Caspary, Knut, Rosenauer, Andreas, Volz, Kerstin
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7578809/
https://www.ncbi.nlm.nih.gov/pubmed/33087734
http://dx.doi.org/10.1038/s41598-020-74434-w

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7578809/
https://www.ncbi.nlm.nih.gov/pubmed/33087734
http://dx.doi.org/10.1038/s41598-020-74434-w

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