Contrast Transfer Function-Based Exit-Wave Reconstruction and Denoising of Atomic-Resolution Transmission Electron Microscopy Images of Graphene and Cu Single Atom Substitutions by Deep Learning Framework

The exit wave is the state of a uniform plane incident electron wave exiting immediately after passing through a specimen and before the atomic-resolution transmission electron microscopy (ARTEM) image is modified by the aberration of the optical system and the incoherence effect of the electron. Al...

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Detalles Bibliográficos
Autores principales: Lee, Jongyeong, Lee, Yeongdong, Kim, Jaemin, Lee, Zonghoon
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7601262/
https://www.ncbi.nlm.nih.gov/pubmed/33036252
http://dx.doi.org/10.3390/nano10101977

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7601262/
https://www.ncbi.nlm.nih.gov/pubmed/33036252
http://dx.doi.org/10.3390/nano10101977

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