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Transfer Durability of Line-Patterned Replica Mold Made of High-Hardness UV-Curable Resin
Ultraviolet nanoimprint lithography (UV-NIL) requires high durability of the mold for the mass production of nanostructures. To evaluate the durability of a line-patterned replica mold made of high-hardness UV curable resin, repetitive transfer and contact angle measurements of the replica mold were...
Autores principales: | Marumo, Tetsuma, Hiwasa, Shin, Taniguchi, Jun |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2020
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7601754/ https://www.ncbi.nlm.nih.gov/pubmed/33019541 http://dx.doi.org/10.3390/nano10101956 |
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