High-resolution cryo-EM using beam-image shift at 200 keV

Recent advances in single-particle cryo-electron microscopy (cryo-EM) data collection utilize beam-image shift to improve throughput. Despite implementation on 300 keV cryo-EM instruments, it remains unknown how well beam-image-shift data collection affects data quality on 200 keV instruments and th...

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Detalles Bibliográficos
Autores principales: Cash, Jennifer N., Kearns, Sarah, Li, Yilai, Cianfrocco, Michael A.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2020
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7642776/
https://www.ncbi.nlm.nih.gov/pubmed/33209328
http://dx.doi.org/10.1107/S2052252520013482

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7642776/
https://www.ncbi.nlm.nih.gov/pubmed/33209328
http://dx.doi.org/10.1107/S2052252520013482

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