Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices

The importance of statistical analyses on 2D materials-based electronic devices and circuits is sometimes overlooked. Here the authors discuss the most pressing integration issues for such devices and emphasize the need for yield, variability, reliability, and stability benchmarking, and outline via...

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Detalles Bibliográficos
Autores principales: Lanza, Mario, Smets, Quentin, Huyghebaert, Cedric, Li, Lain-Jong
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
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Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7655834/
https://www.ncbi.nlm.nih.gov/pubmed/33173041
http://dx.doi.org/10.1038/s41467-020-19053-9

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7655834/
https://www.ncbi.nlm.nih.gov/pubmed/33173041
http://dx.doi.org/10.1038/s41467-020-19053-9

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