Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices

The importance of statistical analyses on 2D materials-based electronic devices and circuits is sometimes overlooked. Here the authors discuss the most pressing integration issues for such devices and emphasize the need for yield, variability, reliability, and stability benchmarking, and outline via...

Descripción completa

Detalles Bibliográficos
Autores principales: Lanza, Mario, Smets, Quentin, Huyghebaert, Cedric, Li, Lain-Jong
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Comment
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7655834/
https://www.ncbi.nlm.nih.gov/pubmed/33173041
http://dx.doi.org/10.1038/s41467-020-19053-9
_version_ 1783608251975204864
author Lanza, Mario
Smets, Quentin
Huyghebaert, Cedric
Li, Lain-Jong
author_facet Lanza, Mario
Smets, Quentin
Huyghebaert, Cedric
Li, Lain-Jong
author_sort Lanza, Mario
collection PubMed
description The importance of statistical analyses on 2D materials-based electronic devices and circuits is sometimes overlooked. Here the authors discuss the most pressing integration issues for such devices and emphasize the need for yield, variability, reliability, and stability benchmarking, and outline viable strategies resulting in research papers that are useful for the industry.
format Online
Article
Text
id pubmed-7655834
institution National Center for Biotechnology Information
language English
publishDate 2020
publisher Nature Publishing Group UK
record_format MEDLINE/PubMed
spelling pubmed-76558342020-11-12 Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices Lanza, Mario Smets, Quentin Huyghebaert, Cedric Li, Lain-Jong Nat Commun Comment The importance of statistical analyses on 2D materials-based electronic devices and circuits is sometimes overlooked. Here the authors discuss the most pressing integration issues for such devices and emphasize the need for yield, variability, reliability, and stability benchmarking, and outline viable strategies resulting in research papers that are useful for the industry. Nature Publishing Group UK 2020-11-10 /pmc/articles/PMC7655834/ /pubmed/33173041 http://dx.doi.org/10.1038/s41467-020-19053-9 Text en © The Author(s) 2020 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
spellingShingle Comment
Lanza, Mario
Smets, Quentin
Huyghebaert, Cedric
Li, Lain-Jong
Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices
title Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices
title_full Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices
title_fullStr Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices
title_full_unstemmed Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices
title_short Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices
title_sort yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices
topic Comment
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7655834/
https://www.ncbi.nlm.nih.gov/pubmed/33173041
http://dx.doi.org/10.1038/s41467-020-19053-9
work_keys_str_mv AT lanzamario yieldvariabilityreliabilityandstabilityoftwodimensionalmaterialsbasedsolidstateelectronicdevices
AT smetsquentin yieldvariabilityreliabilityandstabilityoftwodimensionalmaterialsbasedsolidstateelectronicdevices
AT huyghebaertcedric yieldvariabilityreliabilityandstabilityoftwodimensionalmaterialsbasedsolidstateelectronicdevices
AT lilainjong yieldvariabilityreliabilityandstabilityoftwodimensionalmaterialsbasedsolidstateelectronicdevices

Ejemplares similares