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Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices
The importance of statistical analyses on 2D materials-based electronic devices and circuits is sometimes overlooked. Here the authors discuss the most pressing integration issues for such devices and emphasize the need for yield, variability, reliability, and stability benchmarking, and outline via...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2020
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7655834/ https://www.ncbi.nlm.nih.gov/pubmed/33173041 http://dx.doi.org/10.1038/s41467-020-19053-9 |