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Epitaxial Growth of Silicon on Silicon Wafers by Direct Laser Melting
Additive manufacturing (AM) of brittle materials remains challenging, as they are prone to cracking due to the steep thermal gradients present during melting and cooling after laser exposition. Silicon is an ideal brittle material for study since most of the physical properties of single-element mat...
Autores principales: | , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2020
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7660219/ https://www.ncbi.nlm.nih.gov/pubmed/33113916 http://dx.doi.org/10.3390/ma13214728 |
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author | Le Dantec, Marie Abdulstaar, Mustafa Leparoux, Marc Hoffmann, Patrik |
author_facet | Le Dantec, Marie Abdulstaar, Mustafa Leparoux, Marc Hoffmann, Patrik |
author_sort | Le Dantec, Marie |
collection | PubMed |
description | Additive manufacturing (AM) of brittle materials remains challenging, as they are prone to cracking due to the steep thermal gradients present during melting and cooling after laser exposition. Silicon is an ideal brittle material for study since most of the physical properties of single-element materials can be found in the literature and high-purity silicon powders are readily available. Direct laser melting (DLM) of silicon powder was performed to establish the conditions under which cracks occur and to understand how the solidification front impacts the final microstructure. Through careful control of process conditions, paying special attention to thermal gradients and the growth velocity, epitaxial pillars free of cracks could be grown to a length of several millimeters. |
format | Online Article Text |
id | pubmed-7660219 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2020 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-76602192020-11-13 Epitaxial Growth of Silicon on Silicon Wafers by Direct Laser Melting Le Dantec, Marie Abdulstaar, Mustafa Leparoux, Marc Hoffmann, Patrik Materials (Basel) Communication Additive manufacturing (AM) of brittle materials remains challenging, as they are prone to cracking due to the steep thermal gradients present during melting and cooling after laser exposition. Silicon is an ideal brittle material for study since most of the physical properties of single-element materials can be found in the literature and high-purity silicon powders are readily available. Direct laser melting (DLM) of silicon powder was performed to establish the conditions under which cracks occur and to understand how the solidification front impacts the final microstructure. Through careful control of process conditions, paying special attention to thermal gradients and the growth velocity, epitaxial pillars free of cracks could be grown to a length of several millimeters. MDPI 2020-10-23 /pmc/articles/PMC7660219/ /pubmed/33113916 http://dx.doi.org/10.3390/ma13214728 Text en © 2020 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Communication Le Dantec, Marie Abdulstaar, Mustafa Leparoux, Marc Hoffmann, Patrik Epitaxial Growth of Silicon on Silicon Wafers by Direct Laser Melting |
title | Epitaxial Growth of Silicon on Silicon Wafers by Direct Laser Melting |
title_full | Epitaxial Growth of Silicon on Silicon Wafers by Direct Laser Melting |
title_fullStr | Epitaxial Growth of Silicon on Silicon Wafers by Direct Laser Melting |
title_full_unstemmed | Epitaxial Growth of Silicon on Silicon Wafers by Direct Laser Melting |
title_short | Epitaxial Growth of Silicon on Silicon Wafers by Direct Laser Melting |
title_sort | epitaxial growth of silicon on silicon wafers by direct laser melting |
topic | Communication |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7660219/ https://www.ncbi.nlm.nih.gov/pubmed/33113916 http://dx.doi.org/10.3390/ma13214728 |
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