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Epitaxial Growth of Silicon on Silicon Wafers by Direct Laser Melting

Additive manufacturing (AM) of brittle materials remains challenging, as they are prone to cracking due to the steep thermal gradients present during melting and cooling after laser exposition. Silicon is an ideal brittle material for study since most of the physical properties of single-element mat...

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Autores principales: Le Dantec, Marie, Abdulstaar, Mustafa, Leparoux, Marc, Hoffmann, Patrik
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7660219/
https://www.ncbi.nlm.nih.gov/pubmed/33113916
http://dx.doi.org/10.3390/ma13214728
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author Le Dantec, Marie
Abdulstaar, Mustafa
Leparoux, Marc
Hoffmann, Patrik
author_facet Le Dantec, Marie
Abdulstaar, Mustafa
Leparoux, Marc
Hoffmann, Patrik
author_sort Le Dantec, Marie
collection PubMed
description Additive manufacturing (AM) of brittle materials remains challenging, as they are prone to cracking due to the steep thermal gradients present during melting and cooling after laser exposition. Silicon is an ideal brittle material for study since most of the physical properties of single-element materials can be found in the literature and high-purity silicon powders are readily available. Direct laser melting (DLM) of silicon powder was performed to establish the conditions under which cracks occur and to understand how the solidification front impacts the final microstructure. Through careful control of process conditions, paying special attention to thermal gradients and the growth velocity, epitaxial pillars free of cracks could be grown to a length of several millimeters.
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spelling pubmed-76602192020-11-13 Epitaxial Growth of Silicon on Silicon Wafers by Direct Laser Melting Le Dantec, Marie Abdulstaar, Mustafa Leparoux, Marc Hoffmann, Patrik Materials (Basel) Communication Additive manufacturing (AM) of brittle materials remains challenging, as they are prone to cracking due to the steep thermal gradients present during melting and cooling after laser exposition. Silicon is an ideal brittle material for study since most of the physical properties of single-element materials can be found in the literature and high-purity silicon powders are readily available. Direct laser melting (DLM) of silicon powder was performed to establish the conditions under which cracks occur and to understand how the solidification front impacts the final microstructure. Through careful control of process conditions, paying special attention to thermal gradients and the growth velocity, epitaxial pillars free of cracks could be grown to a length of several millimeters. MDPI 2020-10-23 /pmc/articles/PMC7660219/ /pubmed/33113916 http://dx.doi.org/10.3390/ma13214728 Text en © 2020 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle Communication
Le Dantec, Marie
Abdulstaar, Mustafa
Leparoux, Marc
Hoffmann, Patrik
Epitaxial Growth of Silicon on Silicon Wafers by Direct Laser Melting
title Epitaxial Growth of Silicon on Silicon Wafers by Direct Laser Melting
title_full Epitaxial Growth of Silicon on Silicon Wafers by Direct Laser Melting
title_fullStr Epitaxial Growth of Silicon on Silicon Wafers by Direct Laser Melting
title_full_unstemmed Epitaxial Growth of Silicon on Silicon Wafers by Direct Laser Melting
title_short Epitaxial Growth of Silicon on Silicon Wafers by Direct Laser Melting
title_sort epitaxial growth of silicon on silicon wafers by direct laser melting
topic Communication
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7660219/
https://www.ncbi.nlm.nih.gov/pubmed/33113916
http://dx.doi.org/10.3390/ma13214728
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