3D-printed cellular tips for tuning fork atomic force microscopy in shear mode

Conventional atomic force microscopy (AFM) tips have remained largely unchanged in nanomachining processes, constituent materials, and microstructural constructions for decades, which limits the measurement performance based on force-sensing feedbacks. In order to save the scanning images from disto...

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Detalles Bibliográficos
Autores principales: Sun, Liangdong, Gu, Hongcheng, Liu, Xiaojiang, Ni, Haibin, Li, Qiwei, Zeng, Yi, Chang, Ning, Zhang, Di, Chen, Hongyuan, Li, Zhiyong, Zhao, Xiangwei, Gu, Zhongze
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7661501/
https://www.ncbi.nlm.nih.gov/pubmed/33184281
http://dx.doi.org/10.1038/s41467-020-19536-9

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7661501/
https://www.ncbi.nlm.nih.gov/pubmed/33184281
http://dx.doi.org/10.1038/s41467-020-19536-9

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